InfraTec has developed the E-LIT automation solution specifically for the inspection of electronic and semiconductor modules. Designed as a modular test system, E-LIT uses lock-in thermography to identify and localize thermal anomalies reliably, even in multilayer PCBs and multi-chip modules.Precise Temperature Measurement and Fault Detection
Depending on the spatial resolution of the infrared camera, several hundred thousand to several million pixels can be recorded. The temperature at the surface of the test object is then calculated from the intensity of the detected radiation, with each pixel in the resulting thermal image assigned a discrete temperature value corresponding to a specific area of the object.
Pour en savoir plus : Analysis of Electronic and Semiconductor Modules Using Lock-in Thermography
