{"id":57368,"date":"2026-03-30T09:53:15","date_gmt":"2026-03-30T07:53:15","guid":{"rendered":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/"},"modified":"2026-03-30T09:53:15","modified_gmt":"2026-03-30T07:53:15","slug":"cosmic-a-new-name-in-semiconductor-test","status":"publish","type":"post","link":"https:\/\/www.nae.fr\/en\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/","title":{"rendered":"Cosmic – a new name in semiconductor test"},"content":{"rendered":"
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n\nSemiconductor test specialist Microtest Group (made up of companies Microtest, Test Inspire, Gedec, RoodMicrotec, ipTEST and Focused Test) has now been re-named Cosmic Semiconductor Solutions.\n\nThe aim is to combine all the capabilities into a single global brand, with two complementary divisions \u2013 Cosmic Equipment and Cosmic Services – that will operate independently.\n\n\u201cThe creation of Cosmic represents a fundamental strategic step in our journey to consolidate our position as a leading international player in the semiconductor test industry,\u201d stated Ruud van der Linden, CEO of Cosmic Group. \u201cThe integration of technological, industrial, and operational expertise on a global scale now enables us to offer our customers a unique value proposition that combines innovation, efficiency, and added value.\u00a0\u00bb\n\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div><\/blockquote>\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n
\n\nPour en savoir plus : Cosmic – a new name in semiconductor test<\/a>\n\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>","protected":false},"excerpt":{"rendered":"

Semiconductor test specialist Microtest Group (made up of companies Microtest, Test Inspire, Gedec, RoodMicrotec, ipTEST and Focused Test) has now been re-named Cosmic Semiconductor Solutions. The aim is to combine all the capabilities into a single global brand, with two complementary divisions \u2013 Cosmic Equipment and Cosmic Services – that will operate independently. \u201cThe creation […]<\/p>\n","protected":false},"author":1,"featured_media":57369,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[34,16],"tags":[35,45,30],"class_list":["post-57368","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-innovation-et-technologique","category-rti","tag-actualites","tag-electrification-et-fiabilite-des-systemes-embarques","tag-fiabilite-des-systemes-et-des-composants"],"acf":[],"yoast_head":"\nCosmic - a new name in semiconductor test - NAE<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.nae.fr\/en\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Cosmic - a new name in semiconductor test - NAE\" \/>\n<meta property=\"og:description\" content=\"Semiconductor test specialist Microtest Group (made up of companies Microtest, Test Inspire, Gedec, RoodMicrotec, ipTEST and Focused Test) has now been re-named Cosmic Semiconductor Solutions. The aim is to combine all the capabilities into a single global brand, with two complementary divisions \u2013 Cosmic Equipment and Cosmic Services – that will operate independently. \u201cThe creation […]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.nae.fr\/en\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/\" \/>\n<meta property=\"og:site_name\" content=\"NAE\" \/>\n<meta property=\"article:published_time\" content=\"2026-03-30T07:53:15+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.nae.fr\/wp-content\/uploads\/2026\/06\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"1000\" \/>\n\t<meta property=\"og:image:height\" content=\"666\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"author\" content=\"adminwa\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"adminwa\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/\"},\"author\":{\"name\":\"adminwa\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#\\\/schema\\\/person\\\/3d658e930f01449b7195ce4a78fcfc1e\"},\"headline\":\"Cosmic – a new name in semiconductor test\",\"datePublished\":\"2026-03-30T07:53:15+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/\"},\"wordCount\":137,\"commentCount\":0,\"publisher\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#organization\"},\"image\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.nae.fr\\\/wp-content\\\/uploads\\\/2026\\\/06\\\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg\",\"keywords\":[\"Actualit\u00e9s\",\"Electrification et fiabilit\u00e9 des syst\u00e8mes embarqu\u00e9s\",\"Fiabilit\u00e9 des syst\u00e8mes et des composants\"],\"articleSection\":[\"Innovation et technologique\",\"RTI\"],\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"CommentAction\",\"name\":\"Comment\",\"target\":[\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/#respond\"]}]},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/\",\"url\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/\",\"name\":\"Cosmic - a new name in semiconductor test - NAE\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/#primaryimage\"},\"image\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.nae.fr\\\/wp-content\\\/uploads\\\/2026\\\/06\\\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg\",\"datePublished\":\"2026-03-30T07:53:15+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/#primaryimage\",\"url\":\"https:\\\/\\\/www.nae.fr\\\/wp-content\\\/uploads\\\/2026\\\/06\\\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg\",\"contentUrl\":\"https:\\\/\\\/www.nae.fr\\\/wp-content\\\/uploads\\\/2026\\\/06\\\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg\",\"width\":1000,\"height\":666},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/2026\\\/03\\\/30\\\/cosmic-a-new-name-in-semiconductor-test\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Accueil\",\"item\":\"https:\\\/\\\/www.nae.fr\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Cosmic – a new name in semiconductor test\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#website\",\"url\":\"https:\\\/\\\/www.nae.fr\\\/\",\"name\":\"NAE\",\"description\":\"NAE fili\u00e8re d'excellence...\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.nae.fr\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#organization\",\"name\":\"NAE\",\"url\":\"https:\\\/\\\/www.nae.fr\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/www.nae.fr\\\/wp-content\\\/uploads\\\/2025\\\/10\\\/nae-logo.svg\",\"contentUrl\":\"https:\\\/\\\/www.nae.fr\\\/wp-content\\\/uploads\\\/2025\\\/10\\\/nae-logo.svg\",\"width\":84,\"height\":52,\"caption\":\"NAE\"},\"image\":{\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#\\\/schema\\\/logo\\\/image\\\/\"}},{\"@type\":\"Person\",\"@id\":\"https:\\\/\\\/www.nae.fr\\\/#\\\/schema\\\/person\\\/3d658e930f01449b7195ce4a78fcfc1e\",\"name\":\"adminwa\",\"image\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/5118570d863e9bebccd6a13a0e571e5515c30a2f455e20ed92788cb2b4e5c631?s=96&d=mm&r=g\",\"url\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/5118570d863e9bebccd6a13a0e571e5515c30a2f455e20ed92788cb2b4e5c631?s=96&d=mm&r=g\",\"contentUrl\":\"https:\\\/\\\/secure.gravatar.com\\\/avatar\\\/5118570d863e9bebccd6a13a0e571e5515c30a2f455e20ed92788cb2b4e5c631?s=96&d=mm&r=g\",\"caption\":\"adminwa\"},\"sameAs\":[\"https:\\\/\\\/www.nae.fr\"],\"url\":\"https:\\\/\\\/www.nae.fr\\\/en\\\/author\\\/adminwa\\\/\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"Cosmic - a new name in semiconductor test - NAE","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.nae.fr\/en\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/","og_locale":"en_US","og_type":"article","og_title":"Cosmic - a new name in semiconductor test - NAE","og_description":"Semiconductor test specialist Microtest Group (made up of companies Microtest, Test Inspire, Gedec, RoodMicrotec, ipTEST and Focused Test) has now been re-named Cosmic Semiconductor Solutions. The aim is to combine all the capabilities into a single global brand, with two complementary divisions \u2013 Cosmic Equipment and Cosmic Services – that will operate independently. \u201cThe creation […]","og_url":"https:\/\/www.nae.fr\/en\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/","og_site_name":"NAE","article_published_time":"2026-03-30T07:53:15+00:00","og_image":[{"width":1000,"height":666,"url":"https:\/\/www.nae.fr\/wp-content\/uploads\/2026\/06\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg","type":"image\/jpeg"}],"author":"adminwa","twitter_card":"summary_large_image","twitter_misc":{"Written by":"adminwa","Est. reading time":"1 minute"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/#article","isPartOf":{"@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/"},"author":{"name":"adminwa","@id":"https:\/\/www.nae.fr\/#\/schema\/person\/3d658e930f01449b7195ce4a78fcfc1e"},"headline":"Cosmic – a new name in semiconductor test","datePublished":"2026-03-30T07:53:15+00:00","mainEntityOfPage":{"@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/"},"wordCount":137,"commentCount":0,"publisher":{"@id":"https:\/\/www.nae.fr\/#organization"},"image":{"@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/#primaryimage"},"thumbnailUrl":"https:\/\/www.nae.fr\/wp-content\/uploads\/2026\/06\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg","keywords":["Actualit\u00e9s","Electrification et fiabilit\u00e9 des syst\u00e8mes embarqu\u00e9s","Fiabilit\u00e9 des syst\u00e8mes et des composants"],"articleSection":["Innovation et technologique","RTI"],"inLanguage":"en-US","potentialAction":[{"@type":"CommentAction","name":"Comment","target":["https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/#respond"]}]},{"@type":"WebPage","@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/","url":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/","name":"Cosmic - a new name in semiconductor test - NAE","isPartOf":{"@id":"https:\/\/www.nae.fr\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/#primaryimage"},"image":{"@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/#primaryimage"},"thumbnailUrl":"https:\/\/www.nae.fr\/wp-content\/uploads\/2026\/06\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg","datePublished":"2026-03-30T07:53:15+00:00","breadcrumb":{"@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/#primaryimage","url":"https:\/\/www.nae.fr\/wp-content\/uploads\/2026\/06\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg","contentUrl":"https:\/\/www.nae.fr\/wp-content\/uploads\/2026\/06\/1774278054-Screenshot_2026-03-23_at_14.36.31.jpg","width":1000,"height":666},{"@type":"BreadcrumbList","@id":"https:\/\/www.nae.fr\/2026\/03\/30\/cosmic-a-new-name-in-semiconductor-test\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Accueil","item":"https:\/\/www.nae.fr\/"},{"@type":"ListItem","position":2,"name":"Cosmic – a new name in semiconductor test"}]},{"@type":"WebSite","@id":"https:\/\/www.nae.fr\/#website","url":"https:\/\/www.nae.fr\/","name":"NAE","description":"NAE fili\u00e8re d'excellence...","publisher":{"@id":"https:\/\/www.nae.fr\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.nae.fr\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"},{"@type":"Organization","@id":"https:\/\/www.nae.fr\/#organization","name":"NAE","url":"https:\/\/www.nae.fr\/","logo":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.nae.fr\/#\/schema\/logo\/image\/","url":"https:\/\/www.nae.fr\/wp-content\/uploads\/2025\/10\/nae-logo.svg","contentUrl":"https:\/\/www.nae.fr\/wp-content\/uploads\/2025\/10\/nae-logo.svg","width":84,"height":52,"caption":"NAE"},"image":{"@id":"https:\/\/www.nae.fr\/#\/schema\/logo\/image\/"}},{"@type":"Person","@id":"https:\/\/www.nae.fr\/#\/schema\/person\/3d658e930f01449b7195ce4a78fcfc1e","name":"adminwa","image":{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/secure.gravatar.com\/avatar\/5118570d863e9bebccd6a13a0e571e5515c30a2f455e20ed92788cb2b4e5c631?s=96&d=mm&r=g","url":"https:\/\/secure.gravatar.com\/avatar\/5118570d863e9bebccd6a13a0e571e5515c30a2f455e20ed92788cb2b4e5c631?s=96&d=mm&r=g","contentUrl":"https:\/\/secure.gravatar.com\/avatar\/5118570d863e9bebccd6a13a0e571e5515c30a2f455e20ed92788cb2b4e5c631?s=96&d=mm&r=g","caption":"adminwa"},"sameAs":["https:\/\/www.nae.fr"],"url":"https:\/\/www.nae.fr\/en\/author\/adminwa\/"}]}},"_links":{"self":[{"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/posts\/57368","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/comments?post=57368"}],"version-history":[{"count":0,"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/posts\/57368\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/media\/57369"}],"wp:attachment":[{"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/media?parent=57368"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/categories?post=57368"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.nae.fr\/en\/wp-json\/wp\/v2\/tags?post=57368"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}