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Scopus preview – Scopus – Document details – Developed non-destructive verification methods for accelerated temperature cycling of power MOSFETs

Scopus preview – Scopus – Document details – Developed non-destructive verification methods for accelerated temperature cycling of power MOSFETs

This study deals with the non-destructive test methods applied in the industry for SiC power metal-oxide-semiconductor field-effect transistors (MOSFETs). Scanning acoustic tomography (SAT) is used for testing SiC power MOSFETs, which are widely used in high-power...

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