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In-depth 2D FEM analysis of gate cracking in SiC MOSFETs under repetitive short-circuit conditions: Application of a damage-based model for crack length prediction [ESREF’25 Selected and Extended Full-Paper]

In-depth 2D FEM analysis of gate cracking in SiC MOSFETs under repetitive short-circuit conditions: Application of a damage-based model for crack length prediction [ESREF’25 Selected and Extended Full-Paper]

The on-state resistance RDSON is a key aging indicator of silicon carbide MOSFETs power module. It can provide information on both chip and packaging degradation allowing more reliable power electronic converter. This on-state resistance can be determined using both...

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UAV Systems and Swarm Robotics

UAV Systems and Swarm Robotics

The unstable nature of the dynamics of Unmanned Aerial Vehicles (UAVs) might significantly increase the complexity of their control strategies. In addition, some UAV systems require robust and fast stabilization to perform certain maneuvers. In particular, tail-sitter...

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