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ARLINGTON, Va.–(BUSINESS WIRE)–JEDEC Solid State Technology Association, the global leader in standards development for the microelectronics industry, announces the publication of JEP183: Guidelines for Measuring the Threshold Voltage (VT) of SiC MOSFETs. The first publication developed by JEDEC’s JC-70.2 silicon carbide subcommittee, JEP183 is available for free download from the JEDEC website.

Source : JEDEC Wide Bandgap Power Semiconductor Committee Publishes its First Guideline for Silicon Carbide (SiC) Based Power Conversion Devices | Business Wire